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| Basic parameters | |
| Working Priciple | Energy Dispersive X-Ray Fluorescence |
| Measurement & Weight | 450*650*350mm/32kg |
| Detection limit | 100ppm(Best substance effect) |
| Precision | ±10ppm~0.1% |
| Expanded uncertainty | ≤0.19% — |
| Operating Environment | Temperature-11~46°C Humidity≤70% |
| Operator requirement | Above senior middle school eduction |
| Instrument standard configuration | |
| High Voltage | 0~50kv(Made in China) 0~2mA |
| Detector | Si-pin 145Kev±5 |
| Main structure | High-strength metal frame and industry plastic shell |
| Integrated Computer | Intel SandyBridge highly integrated industrial motherboard & multi-point hand touch |
| Testable Elements | Any 20 Elements from whole elements(Na~U) |




